Posted:2 months ago|
Platform:
On-site
Full Time
Logic BIST (LBIST)
Automatic Test Pattern Generation (ATPG)
DFT Rule Checks (DFT DRC)
Scan chain compression and stitching
Low-power DFT techniques and constraints
Memory BIST (MBIST) including repair mechanisms
Boundary Scan (IEEE 1149.1)
Analog DFT strategies
JTAG architecture and TAP integration
DFT-specific STA constraints
Analog Devices
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