Posted:3 weeks ago|
Platform:
On-site
Full Time
Interfacewith design team to ensure DFT design rules andcoveragesare met. Generating high quality manufacturingATPGtest patterns for stuck-at(SAF), transition fault(TDF)modelsthrough the use ofon-chip test compression techniques. MBISTverification(including repair),testpattern generation through Mentor tool. ATPG(SAF, TDF)and MBISTverification usingunit delay and min/maxtiming cornersimulations. Workwith the Product/Testengineering teams on the delivery of manufacturing test patterns for ATE. Responsible for supporting postsilicondebug effort, issue resolution. Responsible for Diagnostic Tool generation for ATPG,MBISTand bring-up on ATE. Developing,enhancingandmaintainingscripts as necessary Minimum Qualifications: Bachelors degree in Computer Science, Electrical/Electronics Engineering, Engineering, or related field and 2+ years of Hardware Engineering or related work experience. OR Masters degree in Computer Science, Electrical/Electronics Engineering, Engineering, or related field and 1+ year of Hardware Engineering or related work experience. OR PhD in Computer Science, Electrical/Electronics Engineering, Engineering, or related field.Minimum of1-6yearsexperiencein ASIC/DFT- simulation andSilicon validation Detailed knowledge on DFT concepts, pattern simulation, Silicon debugand yield enhancement In depthknowledge andhands-onexperience in ATPG-coverage analysis. In depth knowledge of Memory verification,repairand failure root-cause analysis. Experience withany of thesetoolsisrequired ATPG -TestKompress MBIST- MentorETVerify Simulation -VCS(preferred),modelsim. Expertisein scripting languages such asPerl, shell, etc is an addedadvantage Ability to work in an international team, dynamic environmentwithgood communicationskills Ability to learn and adapt to newtools,methodologies. Ability to do multi-tasking & work on several high priority designs in parallel
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