Responsibilities 6 to 12 years of complete hands-on experience in RTL Verification at both SoC/IP level. Should be proficient in building New or maintain existing SV/UVM/C based testbenches. Experienced in SV-UVM/OVM/VMM Methodologies. Specman hands-on can be a plus. Should have handled Complex Blocks/Hard Macro Level Functional Verification at both RTL and Gate Level. Should have experience dealing with Coverage Models and metrics issue and closure based on specification. Able to develop and track Test Plan & Validation Plans based on Specification. Able to setup Regression environments based on Test Plans. Experience in dealing GPIO, Clock Controller, DFTMUX, System controller such as PMU/CMU/TMU and power issues at SoC level will be an advantage. Knowledge on Power-Aware -CPF/UPF Simulation at both RTL and Timing Simulations at Gate Level. Able to Work closely with the Architecture, Design, Synthesis and Physical Design team teams to resolve the RTL/GLS level issues. Should have knowledge on any of the Bus interface - PCIe/USB/I2C/SPI/UART. Should have worked on AMBS protocols. Technologies: 28nm and below. Experience in Tcl/Tk, PERL, Makefile is a definite Plus. Qualifications Education: B.Tech/BE/ME/M.Tech
Role & responsibilities Must have exposure to NoC, IP/ SoC Design, CDC, AXI, Bus Interconnects
Role & responsibilities- Must have exposure to SoC Verification Programming Languages- C, C++, System Verilog, UVM Protocols- PCIe, AMBA, Ahb, Apb, Axi Notice Period- Immediate to 30 Days
Role & responsibilities 4-9 years of complete hands-on experience in - DFT Architecture, Design, Scan, MBIST, Gate Level simulations with Timing, DFT Constraints, Pattern Generation, and ATE support. Should be familiar with SoC & IP level DFT Architecture and Flows from RTL to production. Able to understand and implement requirements from Test engineering perspective Familiarity with either Synopsys or Tessent Scan flows. Simulation tools: NCSIM/XCELIUM/VCS Should have handled aspects of Scan Scan Insertion, ATPG, Coverage improvement, Pattern Generation on their own. Familiarity with various test pattern formats – STIL, WGL, VEC formats. Experienced in defining DFT constraints, Timing Closure in DFT modes and handling Gate level simulations with timing at various corners. Able to implement ECO flows to resolve issues observed at NETLIST level. Experienced in MBIST flows – Insertion, Simulation and Pattern generation. The ability to deal with Mixed-Signal design test controllability and observability can be a major plus. Should be able to support ATE and HTOL teams for post-silicon debug support. Experience in Tcl/Tk, PERL, Makefile is a Plus Technologies : 28nm andbelow.
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