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0.0 years
0 Lacs
delhi, india
On-site
Education BE/ BTech (Electronics/ Electrical/ Electronics and Communication) MS or MTech would be preferred The Candidate Is Expected To Have Worked On Scan insertion and DRC cleanup Pattern generation for Stuck-At, delay test, iddq, path delay and fault grading. Memory testing. Should also know the algorithms. Should also have knowledge about diagnostics. JTAG or P1500 or other interface mechanism Desirable competencies The Candidate Is Expected To Have Exposure To Compression tools is highly desirable LBIST, mixed-signal testing, logic equivalence Writing testbenches and should be capable of writing RTL code for DFT blocks as and when required. Bridge fault detection is desirable ATE exper...
Posted 2 months ago
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